Heterogeneously Integrated Nitrogen-Vacancy Sensing For Real-Time CMOS Security Threat Detection

M. Ashok,Y. Hu, H. Wang, E.G. Arnault, H.Raniwala, A.G. Amer, M. Trusheim, D.R. Englund, A.P. Chandrakasan, " Heterogeneously Integrated Nitrogen-Vacancy Sensing for Real-Time CMOS Security Threat Detection," in IEEE Transactions on Very Large Scale Integration (VLSI) Systems (Nov. 2025)