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Loop Flattening & Spherical Sampling: Highly Efficient Model Reduction Techniques For SRAM Yield Analysis

Qazi, M., M. Tikekar, L. Dolecek, D. Shah, A. Chandrakasan, "Loop Flattening & Spherical Sampling: Highly Efficient Model Reduction Techniques for SRAM Yield Analysis," Design, Automation and Test in Europe (DATE), pp. 801-806, March 2010. [Slides]