An All-Digital, Highly-Scalable Architecture For Measurement Of Spatial Variation In Digital Circuits

Drego, N., A. P. Chandrakasan, and D. Boning, "An All-Digital, Highly-Scalable Architecture for Measurement of Spatial Variation in Digital Circuits," IEEE Asian Solid-State Circuits Conference, pp. 393-396, November 2008. [Slides]