Cell Library Characterization At Low Voltage Using Non-linear Operating Point Analysis Of Local Variations

Rithe, R., S. Chou, J. Gu, A. Wang, S. Datla, G. Gammie, D. Buss, A. Chandrakasan, "Cell Library Characterization at Low Voltage using Non-linear Operating Point Analysis of Local Variations," International Conference on VLSI Design, Jan 2011. [Slides]